Shielded field emission EPMA for microanalysis of radioactive materials
نویسندگان
چکیده
منابع مشابه
Electron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
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ژورنال
عنوان ژورنال: IOP Conference Series: Materials Science and Engineering
سال: 2012
ISSN: 1757-899X
DOI: 10.1088/1757-899x/32/1/012022